A quick look at the demonstration of the perClass Mira Stage and Software at SPIE Photonics West 2024 in San Francisco, California, at the Headwall-perClass booth.
In this demonstration, different types of black fabrics are scanned on the perClass Mira Stage using the Headwall MV.C NIR hyperspectral sensor. As they are scanned, the monitor shows the perClass Mira Software as it identifies each type of fabric.
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